This product is a high-performance probe for atomic force microscopy (AFM). As a core AFM consumable, it is designed for high-precision research needs. In response to common market challenges such as short probe lifetime, unstable resolution and poor consistency, Semicon Global Tech develops advanced probes to provide more reliable and clearer imaging performance for demanding microscopic research.

• Tip radius can reach the 10-nanometer scale. The micro-cantilever length and thickness are strictly calibrated to support high-sensitivity sample scanning.
• The process introduces advanced dry etching beyond traditional wet etching, enabling more precise control of tip sharpness and geometry and improving probe resolution and consistency.